Free Web-Based Seminar from Keithley Examines Tips, Tricks, and Traps for Testing Power Semiconductor Devices

June 20th, 2012 - 10:51 am ET by Business Wire

Free Web-Based Seminar from Keithley Examines Tips, Tricks, and Traps for Testing Power Semiconductor DevicesKeithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled “Tips, Tricks, and Traps for Testing Power Semiconductor Devices” on ...

Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled “Tips, Tricks, and Traps for Testing Power Semiconductor Devices” on Thursday, June 28, 2012. This one-hour seminar is designed to help engineers and scientists who are making the transition from testing small-signal devices to testing power semiconductor devices prepare for the new measurement challenges involved. To register for this event, visit www.keithley.com/events/semconfs/webseminars.

This webinar will identify some of the common electrical measurement challenges associated with high power semiconductor device testing and review methods to address them. A variety of topics will be covered:

  • Detecting and suppressing device oscillation
  • Configuring instruments to achieve accurate pulsed measurements at up to 100A
  • Employing capabilities of source measurement units like Keithley’s new High Power System SourceMeter® instruments to verify instrument setup for pulsed I-V measurement
  • Ensuring operator safety and instrument and device protection while making high voltage breakdown and leakage current measurements
  • Providing proper grounding and establishing a common reference for multiple bench or rack-mounted instruments

This webinar is appropriate for any engineer with a basic understating of testing multi-terminal semiconductor devices, including MOSFETs, BJTs, IGBTs, diodes, and thyristors. It is well-suited for anyone responsible for using high power to test such devices.

Jennifer Cheney, the seminar presenter, is a staff applications engineer at Keithley Instruments, Inc. in Cleveland, Ohio, which is part of the Tektronix test and measurement portfolio. Jennifer earned a bachelor of science degree in electrical engineering from Case Western Reserve University (Cleveland, Ohio). She has been assisting Keithley customers with instrument applications since 2001.

For More Information
To register to participate in the online seminar, scheduled for Thursday, June 28, at 15:00 CEST (9:00 AM EDT/13:00 UTC) for European participants and at 2:00 PM EDT (18:00 UTC) for North American participants, visit www.keithley.com/events/semconfs/webseminars. To learn more about Keithley, contact the company at:

            Telephone:     888-534-8453
440-248-0400
FAX: 440-248-6168
E-mail:

publisher@keithley.com

Internet:

www.keithley.com

Address: Keithley Instruments, Inc.
28775 Aurora Road
Cleveland, OH 44139-1891
 

About Keithley Instruments, Inc.
With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of products for their critical measurement needs and a rich understanding of their applications to improve the quality of their products and reduce their cost of test. In 2010, Keithley Instruments joined Tektronix as part of its test and measurement portfolio.

Products and company names listed are trademarks or trade names of their respective companies.

Contacts :

Keithley Instruments, Inc.
Laurel Brennan, 440-498-2567
lbrennan@keithley.com
or
Reader Inquiries: 1-888-534-8453
Twitter: www.twitter.com/keithleyinst


Source(s) : Keithley Instruments, Inc.