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Advantest and JEM Receive Best Overall Presentation Award at IEEE SWTW 2012
Advantest Corporation (TSE: 6857, NYSE: ATE) today announced that the company received the Best Overall Presentation Award at the 22nd Annual IEEE SWTW (Semiconductor Wafer Test Workshop) for a joint presentation ...
Press published on the July 5th, 2012 - 7:10 AM ET